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pcn# : p315a issue date : feb. 04, 2013 design/process change notification this is to inform you that a change is being made to the products listed below. unless otherwise indicated in the details of this notification, the identified change will have no impact on product quality, reliability, electrical, visual or mechanical performance and affected products will remain fully compliant to all published specifications. products incorporating this change may be shipped interchangeably with existing unchanged products. this change is planned to take effect in 90 calendar days from the date of this notification. please work with your local fairchild sales representative to manage your inventory of unchanged product if your evaluation of this change will require more than 90 calendar days. please contact your local customer quality engineer within 30 days of receipt of this notification if you require any additional data or samples. alternatively, you may send an email request for data, samples or other information to pcnsupport@fairchildsemi.com. implementation of change: expected first shipment date for changed product : may. 05, 2013 expected first date code of changed product :1327 description of change (from) : 5/6-in wafer fabrication line at fairchild semiconductor bucheon korea. description of change (to) : 8-in wafer fabrication line at fairchild semiconductor bucheon korea. reason for change: fairchild semiconductor is increasing wafer fabrication capacity by qualifying an 8-in wafer fabrication line at fairchild semiconductor bucheon korea. quality and reliability remain at the highest standards already demonstrated within fairchild's existing products. the reliability qualification results used to qualify the 8-in wafer fabrication line are summarized below. the specific groups of products/mosfet technologies are listed in the affected fsids list. design, die size and layout of the affected products will remain unchanged. there are no changes in the datasheet or electrical performance. 1 of 14
affected product(s): fca20n60 fca20n60f fca20n60fs fca20n60s_f109 fca20n60_f109 fca35n60 fca47n60 fca47n60f fca47n60f_sn00171 fca47n60_f109 fcb11n60tm fcb20n60ftm fcb20n60tm fcbb20ch60sf fcd4n60tm fcd5n60tm fcd5n60tm_ws fcd7n60tm fcd7n60tm_ws fch35n60 fch47n60f_f133 fch47n60_f133 fci7n60 fcp11n60 fcp11n60f fcp11n60_g fcp16n60 fcp16n60_g fcp190n60 fcp190n60e fcp20n60 fcp20n60fs fcp20n60_g fcp260n60e fcp380n60 fcp380n60e fcp4n60 fcp7n60 fcpf11n60 fcpf11n60f fcpf11n60t fcpf11n60_g fcpf11n65 fcpf11n65_g fcpf16n60 fcpf190n60 fcpf190n60e fcpf20n60 fcpf20n60fs fcpf20n60s fcpf20n60st fcpf20n60st_g fcpf20n60t fcpf260n60e fcpf380n60 fcpf380n60e fcpf400n60 fcpf7n60 fcpf7n60ydtu fcu5n60tu fda24n40f fda24n50 fda24n50f fda28n50 fda28n50f fda33n25 fda38n30 fda50n50 fda59n25 fda59n30 fda69n25 fda70n20 fdb12n50tm fdb20n50f fdb28n30tm fdb33n25tm fdb44n25tm fdb52n20tm fdd3n50nztm fdd5n50nzftm fdd5n50nztm fdd6n20tm fdd6n25tm fdd6n50ftm fdd8n50nztm fdh45n50f_f133 fdh50n50_f133 fdl100n50f fdp12n50nz fdp15n40 fdp18n20f fdp19n40 fdp22n50n fdp24n40 fdp26n40 fdp33n25 fdp39n20 fdp51n25 fdp52n20 fdp5n50nz fdp61n20 fdp8n50nz fdpf12n50nz fdpf13n50nz fdpf18n20ft fdpf33n25t fdpf33n25trdtu fdpf39n20 fdpf39n20tldtu fdpf3n50nz fdpf44n25t fdpf51n25 fdpf51n25rdtu fdpf51n25ydtu fdpf5n50nz fdpf5n50nzf fdpf5n50nzft fdpf5n50nzu fdpf8n50nz fdpf8n50nzf 2 of 14
affected product(s): fdpf8n50nzu fdpf9n50nz fga40n65smd fgd4536tm fgh20n60sfdtu fgh20n60ufdtu fgh40n60sfdtu fgh40n60sftu fgh40n60smd fgh40n60smdf fgh40n60ufdtu fgh40n60ufdtu_sn00006 fgh40n60uftu fgh40n60uftu_sn00007 fgh40n65ufdtu fgh80n60fd2tu fgh80n60fdtu fgpf4533 fgpf4533rdtu fgpf4536 fgpf4536jdtu fgpf4536ydtu fgpf4633rdtu fgpf4633tu fgpf4636ydtu pcfc11n60w PCFC20N60W pcfc47n60fw pcfc47n60fw_sn00201 pcfg40n65smw 3 of 14
qualification plan device package process no. of lots q20120257 fda59n25 tt3p0003 unifet1 150~250v 3 reliability test condition standard device name fda59n25 fda59n25 fda59n25 lot no. q20120257aa q20120257ab q20120257ac duration result/fa result/fa result/fa htgb 100 % rated vgs, tj max=150c jesd22 - a108 1000hrs 0/77 0/77 0/77 htrb 80% of rated bv, tj max=150c jesd22 - a108 1000hrs 0/77 0/77 0/77 htsl 150 c jesd22 - a103 1000hrs 0/77 0/77 0/77 hast 130 c, 85% rh, vds=42v jesd22 - a110 96hrs 0/77 0/77 0/77 prcl delta 100c, 5 min on, 3.5 min off mil - std - 750- 1036 6000 cyc le s 0/77 0/77 0/77 rsdh 26 0c jesd22 - b106 10 sec 0/30 0/30 0/30 tmcl - 65 c to 150 c, 30 min/ cycles jesd22 - a104 500 cyc le s 0/77 0/77 0/77 4 of 14
qualification plan device package process no. of lots q20120259 fdh50n50_f133 to247003 unifet1 300~500v (over 24a) 3 reliability test condition standard device name fdh50n50_f133 fdh50n50_f133 fdh50n50_f133 lot no. q20120259aa q20120259ab q20120259ac duration result/fa result/fa result/fa htgb 100 % rated vgs, tj max=150 c jesd22 - a108 1000hrs 0/77 0/77 0/77 htrb 80% of rated bv, tj max=150 c jesd22 - a108 1000hrs 0/77 0/77 0/77 htsl 150 c jesd22 - a103 1000hrs 0/77 0/77 0/77 hast 130 c, 85% rh, vds=42v jesd22 - a110 96hrs 0/77 0/77 0/77 prcl delta 100c, 5 min on, 3.5 min off mil - std - 750- 1036 6000 cyc le s 0/77 0/77 0/77 rsdh 26 0c jesd22 - b106 10 sec 0/30 0/30 0/30 tmcl - 65 c to 150 c, 30 min/ cycles jesd22 - a104 500 cyc le s 0/77 0/77 0/77 5 of 14
qualification plan device package process no. of lots q20120260 fdp22n50n to220003 unifet2 500v 3 reliability test condition standard device name fdp22n50n fdp22n50n fdp22n50n lot no. q20120260aa q20120260ab q20120260ac duration result/fa result/fa result/fa htgb 100 % rated vgs, tj max=150c jesd22 - a108 1000hrs 0/77 0/77 0/77 htrb 80% of rated bv, tj max=150c jesd22 - a108 1000hrs 0/77 0/77 0/77 htsl 150 c jesd22 - a103 1000hrs 0/77 0/77 0/77 hast 130 c, 85% rh, vds=42v jesd22 - a110 96hrs 0/77 0/77 0/77 prcl delta 100c, 3.5 min on, 3.5 min off mil - std - 750- 1036 8572 cyc le s 0/77 0/77 0/77 rsdh 26 0c jesd22 - b106 10 sec 0/30 0/30 0/30 tmcl - 65 c to 150 c, 30 min/ cycles jesd22 - a104 500 cyc le s 0/77 0/77 0/77 qualification plan device package process no. of lots q20120263 fcp20n60 to220003 super - fet 600v to220 3 reliability test condition standard device name fcp20n60 fcp20n60 fcp20n60 lot no. q20120263aa q20120263ab q20120263ac duration result/fa result/fa result/fa htgb 100 % rated vgs, tj max=150c jesd22 - a108 1000hrs 0/77 0/77 0/77 htrb 80% of rated bv, tj max=150c jesd22 - a108 1000hrs 0/77 0/77 0/77 htsl 150 c jesd22 - a103 1000hrs 0/77 0/77 0/77 hast 130 c, 85% rh, vds=42v jesd22 - a110 96hrs 0/77 0/77 0/77 prcl delta 100c, 3.5 min on, 3.5 min off mil - std - 750- 1036 8572 cyc le s 0/77 0/77 0/77 rsdh 26 0c jesd22 - b106 10 sec 0/30 0/30 0/30 tmcl - 65 c to 150 c, 30 min/ cycles jesd22 - a104 500 cyc le s 0/77 0/77 0/77 6 of 14
qualification plan device package process no. of lots q20120265 fcb20n60tm tt263002 super - fet 600v d2pak 1 reliability test condition standard device name fcb20n60tm lot no. q20120265aa duration result/fa precon l1 245c jesd22 - a113 5 cycles 24 hrs 0/154 htgb 100 % rated vgs, tj max=150c jesd22 - a108 1000hrs 0/77 htrb 80% of rated bv, tj max=150c jesd22 - a108 1000hrs 0/77 htsl 150 c jesd22 - a103 1000hrs 0/77 hast 130 c, 85% rh, vds=42v jesd22 - a110 96hrs 0/77 prcl delta 100c, 3.5 min on, 3.5 min off mil - std - 750 - 1036 8572 cyc le s 0/77 rsdh 26 0c jesd22 - b106 1 0 sec 0/30 tmcl - 65 c to 150 c, 30 min/ cycles jesd22 - a104 500 cyc le s 0/77 qualification plan device package process no. of lots q20120266 fdb52n20tm tt263002 unifet 200v(include 250v /dpak and d2 pak) 1 reliability test condition standard device name fdb52n20tm lot no. q20120266aa duration result/fa precon l1 245c jesd22 - a113 5 cycles 24 hrs 0/154 htgb 100 % rated vgs, tj max=150c jesd22 - a108 1000hrs 0/77 htrb 80% of rated bv, tj max=150c jesd22 - a108 1000hrs 0/77 htsl 150 c jesd22 - a103 1000hrs 0/77 hast 130 c, 85% rh, vds=42v jesd22 - a110 96hrs 0/77 prcl delta 100c, 3.5 min on, 3.5 min off mil - std - 750 - 1036 8572 cyc le s 0/77 rsdh 26 0c jesd22 - b106 15 sec 0/30 tmcl - 65 c to 150 c, 30 min/ cycles jesd22 - a104 500 cyc le s 0/77 7 of 14
qualification plan device package process no. of lots q20120267 fdb12n50tm tt263002 unifet1 300 - 500 v _d2pak 1 reliability test condition standard device name fdb12n50tm lot no. q20120267aa duration result/fa precon l1 245c jesd22 - a113 5 cycles 24 hrs 0/154 htgb 100 % rated vgs, tj max=150c jesd22 - a108 1000hrs 0/77 htrb 80% of rated bv, tj max=150c jesd22 - a108 1000hrs 0/77 htsl 150 c jesd22 - a103 1000hrs 0/77 hast 130 c, 85% rh, vds=42v jesd22 - a110 96hrs 0/77 prcl delta 100c, 2 min on, 3.5 min off mil - std - 750 - 1036 8572 cyc le s 0/77 rsdh 26 0c jesd22 - b106 1 0 sec 0/30 tmcl - 65 c to 150 c, 30 min/ cycles jesd22 - a104 500 cyc le s 0/77 qualification plan device package process no. of lots q20120268 fca47n60 tt3p0003 superfet 600v to3p/to247 1 reliability test condition standard device name fca47n60 lot no. q20120268aa duration result/fa htgb 100 % rated vgs, tj max=150c jesd22 - a108 1000hrs 0/77 htrb 80% of rated bv, tj max=150c jesd22 - a108 1000hrs 0/77 htsl 150 c jesd22 - a103 1000hrs 0/77 hast 130 c, 85% rh, vds=42v jesd22 - a110 96hrs 0/77 prcl delta 100c, 5 min on, 3.5 min off mil - std - 750- 1036 6000 cyc le s 0/77 rsdh 26 0c jesd22 - b106 1 0 sec 0/30 tmcl - 65 c to 150 c, 30 min/ cycles jesd22 - a104 500 cyc le s 0/77 8 of 14
qualification plan device package process no. of lots q20120269 fgd4536tm tt252003 pdp 4gen trench igbt_360v dpak 1 reliability test condition standard device name fgd4536tm lot no. q20120269aa duration result/fa precon l1 2 60 c jesd22 - a113 5 cycles 24 hrs 0/154 htgb 100 % rated vgs, tj max=150c jesd22 - a108 1000hrs 0/77 htrb 80% of rated bv, tj max=150c jesd22 - a108 1000hrs 0/77 htsl 150 c jesd22 - a103 1000hrs 0/77 hast 130 c, 85% rh, vds=42v jesd22 - a110 96hrs 0/77 prcl delta 100c, 2 min on, 3.5 min off mil - std - 750 - 1036 10000 cyc le s 0/77 rsdh 26 0c jesd22 - b106 1 0 sec 0/30 tmcl - 65 c to 150 c, 30 min/ cycles jesd22 - a104 500 cyc le s 0/77 qualification plan device package process no. of lots q20120270 fcd7n60tm tt252002 superfet_600v dpak 1 reliability test condition standard device name fcd7n60tm lot no. q20120270aa duration result/fa precon l1 2 60 c jesd22 - a113 5 cycles 24 hrs 0/154 htgb 100 % rated vgs, tj max=150c jesd22 - a108 1000hrs 0/77 htrb 80% of rated bv, tj max=150c jesd22 - a108 1000hrs 0/77 htsl 150 c jesd22 - a103 1000hrs 0/77 hast 130 c, 85% rh, vds=42v jesd22 - a110 96hrs 0/77 prcl delta 100c, 2 min on, 3.5 min off mil - std - 750 - 1036 10000 cyc le s 0/77 rsdh 26 0c jesd22 - b106 1 0 sec 0/30 tmcl - 65 c to 150 c, 30 min/ cycles jesd22 - a104 500 cyc le s 0/77 9 of 14
qualification plan device package process no. of lots q20120271 fdd7n60nztm tt252003 unifet2 600v dpak 1 reliability test condition standard device name fdd7n60nztm lot no. q20120271aa duration result/fa precon l1 2 60?c jesd22 - a113 5 cycles 24 hrs 0/154 htgb 100 % rated vgs, tj max=150c jesd22 - a108 1000hrs 0/77 htrb 80% of rated bv, tj max=150c jesd22 - a108 1000hrs 0/77 htsl 150 c jesd22 - a103 1000hrs 0/77 hast 130 c, 85% rh, vds=42v jesd22 - a110 96hrs 0/77 prcl delta 100c, 2 min on, 3.5 min off mil - std - 750 - 1036 10000 cyc le s 0/77 rsdh 26 0c jesd22 - b106 10 sec 0/30 tmcl - 65 c to 150 c, 30 min/ cycles jesd22 - a104 500 cyc le s 0/77 qualification plan device package process no. of lots q20120272 fcp190n60 tt220003 super - fet2 600v 3 reliability test condition standard device name fcp190n60 fcp190n60 fcp190n60 lot no. q20120272aa q20120272ab q20120272ac duration result/fa result/fa result/fa htgb 100 % rated vgs, tj max=150c jesd22 - a108 1000hrs 0/77 0/77 0/77 htrb 80% of rated bv, tj max=150c jesd22 - a108 1000hrs 0/77 0/77 0/77 htsl 150 c jesd22 - a103 1000hrs 0/77 0/77 0/77 hast 130 c, 85% rh, vds=42v jesd22 - a110 96hrs 0/77 0/77 0/77 prcl delta 100c, 2 min on, 3.5 min off mil - std - 750- 1036 8572 cyc le s 0/77 0/77 0/77 rsdh 26 0c jesd22 - b106 10 sec 0/30 0/30 0/30 tmcl - 65 c to 150 c, 30 min/ cycles jesd22 - a104 500 cyc le s 0/77 0/77 0/77 10 of 14
qualification plan device package process no. of lots q20120273 fcpf190n60 tf22s003 superfet2 600v to220f 1 reliability test condition standard device name fcpf190n60 lot no. q20120273aa duration result/fa htgb 100 % rated vgs, tj max=150c jesd22 - a108 1000hrs 0/77 htrb 80% of rated bv, tj max=150c jesd22 - a108 1000hrs 0/77 htsl 150 c jesd22 - a103 1000hrs 0/77 hast 130 c, 85% rh, vds=42v jesd22 - a110 96hrs 0/77 prcl delta 100c, 2 min on, 3.5 min off mil - std - 750- 1036 8572 cyc le s 0/77 rsdh 26 0c jesd22 - b106 1 0 sec 0/30 tmcl - 65 c to 150 c, 30 min/ cycles jesd22 - a104 500 cyc le s 0/77 qualification plan device package process no. of lots q20120277 fdd6n50tm tt252002 unifet1 300 - 500v/dpak ipak 1 reliability test condition standard device name fdd6n50tm lot no. q20120277aa duration result/fa precon l1 2 60?c jesd22 - a113 5 cycles 24 hrs 0/154 htgb 100 % rated vgs, tj max=150c jesd22 - a108 1000hrs 0/77 htrb 80% of rated bv, tj max=150c jesd22 - a108 1000hrs 0/77 htsl 150 c jesd22 - a103 1000hrs 0/77 hast 130 c, 85% rh, vds=42v jesd22 - a110 96hrs 0/77 prcl delta 100c, 2 min on, 3.5 min off mil - std - 750 - 1036 10000 cyc le s 0/77 rsdh 26 0c jesd22 - b106 1 0 sec 0/30 tmcl - 65 c to 150 c, 30 min/ cycles jesd22 - a104 500 cyc le s 0/77 11 of 14
qualification plan device package process no. of lots q20130022a fcb20n60ftm tt263002 superfet fr fet 2 fch47n60f_f133 to247003 1 reliability test condition standard device name fcb20n60ftm fcb20n60ftm fch47n60f_f133 lot no. q20130022aa q20130022ab q20130022ba duration result/fa result/fa result/fa precon l1 2 45?c jesd22 - a113 5 cycles 24 hrs 0/154 0/154 - htgb 100 % rated vgs, tj max=150c jesd22 - a108 1000hrs 0/77 0/77 0/77 htrb 80% of rated bv, tj max=150c jesd22 - a108 1000hrs 0/77 0/77 0/77 htsl 150 c jesd22 - a103 1000hrs 0/77 0/77 0/77 hast 130 c, 85% rh, vds=42v jesd22 - a110 96hrs 0/77 0/77 0/77 prcl delta 100c, 2 min on, 3.5 min off mil - std - 750- 1036 8572 cycles 5000 cyc le s 0/77 0/77 0/77 rsdh 26 0c jesd22 - b106 10 sec 0/30 0/30 0/30 tmcl - 65 c to 150 c, 30 min/ cycles jesd22 - a104 500 cyc le s 0/77 0/77 0/77 12 of 14
qualification plan device package process no. of lots q20130023 fgpf4633tu tf22s003 pdp 4gen trench igbt 330v_360v to220f 3 reliability test condition standard device name fgpf4633tu fgpf4633tu fgpf4633tu lot no. q20130023aa q20130023ab q20130023ac duration result/fa result/fa result/fa htgb 100 % rated vgs, tj max=150c jesd22 - a108 1000hrs 0/77 0/77 0/77 htrb 80% of rated bv, tj max=150c jesd22 - a108 1000hrs 0/77 0/77 0/77 htsl 150 c jesd22 - a103 1000hrs 0/77 0/77 0/77 hast 130 c, 85% rh, vds=42v jesd22 - a110 96hrs 0/77 0/77 0/77 prcl delta 100c, 2 min on, 3.5 min off mil - std - 750- 1036 8572 cyc le s 0/77 0/77 0/77 rsdh 26 0c jesd22 - b106 10 sec 0/30 0/30 0/30 tmcl - 65 c to 150 c, 30 min/ cycles jesd22 - a104 500 cyc le s 0/77 0/77 0/77 qualification plan device package process no. of lots q20130024 fcp20n60 to220003 super - fet 600v to220 1 reliability test condition standard device name fcp20n60 lot no. q20130024aa duration result/fa htgb 100 % rated vgs, tj max=150c jesd22 - a108 1000hrs 0/77 htrb 80% of rated bv, tj max=150c jesd22 - a108 1000hrs 0/77 htsl 150 c jesd22 - a103 1000hrs 0/77 hast 130 c, 85% rh, vds=42v jesd22 - a110 96hrs 0/77 prcl delta 100c, 2 min on, 3.5 min off mil - std - 750- 1036 8572 cyc le s 0/77 rsdh 26 0c jesd22 - b106 1 0 sec 0/30 tmcl - 65 c to 150 c, 30 min/ cycles jesd22 - a104 500 cyc le s 0/77 13 of 14
qualification plan device package process no. of lots q20130020 fgh40n60smd to247003 fs igbt 600v 3 reliability test condition standard device name fgh40n60smd fgh40n60smd fgh40n60smd lot no. q20130020aa q20130020ab q20130020ac duration result/fa result/fa result/fa htgb 100 % rated vgs, tj max=1 75 c jesd22 - a108 1000hrs 0/77 0/77 0/77 htrb 80% of rated bv, tj max=1 75 c jesd22 - a108 1000hrs 0/77 0/77 0/77 htsl 150 c jesd22 - a103 1000hrs 0/77 0/77 0/77 hast 130 c, 85% rh, vds=42v jesd22 - a110 96hrs 0/77 0/77 0/77 prcl delta 100c, 5 min on, 5 min off mil - std - 750- 1036 6000 cyc le s 0/77 0/77 0/77 tmcl - 65 c to 150 c, 30 min/ cycles jesd22 - a104 500 cyc le s 0/77 0/77 0/77 14 of 14

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